自动化测试计算机测量与控制2006_电子资料文库 关键词:IEEE1149. 4;互连测试;数模混合电路;故障诊断 [gap=618]Key words; IEEE1149. 4; interconnect test; mixed一signal circuit; fault diagnosis
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Besides, neural network models are firstly established for resolving the problem of MCM interconnect test. And the validity of the models has been verified.
此外，为解决MCM的互连测试问题，率先提出了用于MCM互连测试生成的神经网络模型，并验证了模型的正确性。
参考来源 - 基于蚂蚁算法的时序电路测试生成研究·2,447,543篇论文数据，部分数据来源于NoteExpress
As a standard DFT method, IEEE 1149.1 boundary-scan technique (BST) provides measures to complex interconnect test and can well make up the shortcoming of traditional test techniques.
基于IEEE 1149.1标准的边界扫描技术(BST)作为一种标准化的可测性设计方法，弥补了传统测试的缺陷，为复杂的电路互连提供了测试手段。
This paper studies the crosstalk fault and its methods of test pattern generation in high-speed interconnect circuits.
本论文针对高速互连电路串扰型故障及测试生成方法进行研究。
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